X-ray Microscopy Techniques for Nanostructure Analysis
نویسندگان
چکیده
منابع مشابه
Data preparation and evaluation techniques for x-ray diffraction microscopy.
The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. We show here that the first step in data analysis, the assembly of two-...
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X-Ray Diffraction (XRD) has long been used to determine the atomic-scale structure of materials. This technique is based on the fact that the wavelength of X-rays is comparable to the distances between atoms in condensed matter. When a material exhibiting a long-range (i.e. at least micrometers), periodic atomic order, such as a crystal, is irradiated with X-rays it acts as an extended, well-de...
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This article has no abstract.
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Recent advances in single-photon-counting detectors are enabling the development of novel approaches to reach micrometer-scale resolution in x-ray imaging. One example of such a technology are the MEDIPIX3RX-based detectors, such as the LAMBDA which can be operated with a small pixel size in combination with real-time on-chip charge-sharing correction. This characteristic results in a close to ...
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The soft-X ray range, between 1-10 nm wavelength, is highly interesting for X-ray microscopy. Taking advantage of it requires, however, to operate a high resolution instrument at a variable wavelength. We describe here an image converter X-ray microscope which is based on secondary pharoemission. This instrument is now developped at the Institut dlOptique (Orsay); it will be installed near ACO ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2006
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927606062398